The effect of random thiessen structure and random processes on the measurement of spatial auto-correlation
Document Type
Conference Paper
Conference Name
Fourteenth Annual Pittsburgh Conference on Modelling and Simulation
Conference Location
Pittsburgh, PA
Publication (Name of Journal)
Proceedings of the Fourteenth Annual Pittsburgh Conference on Modelling and Simulation
Department
Office of the Provost
Publisher
University of Pittsburgh
Recommended Citation
Amrhein, C.,
Griffith, D.,
Guevara, J.
(1983). The effect of random thiessen structure and random processes on the measurement of spatial auto-correlation. Proceedings of the Fourteenth Annual Pittsburgh Conference on Modelling and Simulation, 585-589.
Available at:
https://ecommons.aku.edu/book_chapters/263
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Comments
This work was published before the author joined Aga Khan University.